- Home
- Products
- EMTEST
- Voltage Surge Generators
- VCS 500N7T
Combined combination wave / Telecom surge generator
Surge pulses occur due to direct or indirect lightning strokes to an external (outdoor) circuit. This leads to currents or electromagnetic fields causing high voltage or current transients. Another source for surge pulses are switching transients originating from switching disturbances and systems faults.Due to this phenomenon, nearly every electrical and electronical device may suffer from such lightning events which justifies the necessity of surge tests being widely performed. Surge voltage can reach several thousands of volts and surge current is seen to reach several thousands of amps.
Highlights
Surge voltage up to 7 kV
Surge current up to 3.5 kA
Telecom surge voltage up to 7 kV
Telecom surge current up to 465 A
Voltage/current monitors
Built-in 1ph CDN 16 A
Interlock
Warning lamp control
Manual operation
USB and GPIB interface
Benefits
VCS 500N7T - compact surge / telecom surge generator with integrated CDNEMTEST VCS 500N7T unifies the test capabilities for wave surge and telecom surge testing in one unit up to 7kV. Moreover, it offers built-in coupling/decoupling networks for single phase AC power port and telecom port testing.
For combination wave surge tests on high-current mains supply lines its capability can be extended by an external CDN to achieve nominal currents of 100 A and more per phase.
By selecting the desired coupling, the source impedance and the coupling capacitor is set automatically whatever CDN is connected.
Fail inputs are offered as standard for DUT monitoring purposes. Peak values of voltage and current are shown in the display and these values are transferred to the software for reporting.To comply with safety regulations the VCS 500N7T is equipped with a contact to control warning lamps and with a safety interlock.
Pre-programmed Standard Test routines allow highest user convenience. Still the VCS 500N7T offers the quick start test routine where parameters can be changed on-line during the test to evaluate the susceptibility level of an individual DUT.
EN 300329
EN 300340
EN 300342-1
EN 300386-2
EN 300386 V1.3.2
EN 301489-1
EN 301489-17
EN 301489-24
EN 301489-7
EN 61000-4-5
EN 61000-4-9
EN 61000-6-1
EN 61000-6-2
FCC 97-270 (part 68)
IEC 60255-22-5
IEC 61000-4-5
IEC 61000-4-9
IEC 61326
IEC 61850-3
ITU-T K.12
ITU-T K.20
ITU-T K.21
ITU-T K.45
EN 300340
EN 300342-1
EN 300386-2
EN 300386 V1.3.2
EN 301489-1
EN 301489-17
EN 301489-24
EN 301489-7
EN 61000-4-5
EN 61000-4-9
EN 61000-6-1
EN 61000-6-2
FCC 97-270 (part 68)
IEC 60255-22-5
IEC 61000-4-5
IEC 61000-4-9
IEC 61326
IEC 61850-3
ITU-T K.12
ITU-T K.20
ITU-T K.21
ITU-T K.45